Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156 - MRS Proceedings - Martin Gall - Books - Cambridge University Press - 9781107408319 - June 5, 2014
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Martin Gall
Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156 - MRS Proceedings

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

204 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 5, 2014
ISBN13 9781107408319
Publishers Cambridge University Press
Pages 204
Dimensions 152 × 229 × 11 mm   ·   433 g   (Weight (estimated))
Language English  
Editor Gall, Martin
Editor Grill, Alfred (IBM T J Watson Research Center, New York)
Editor Koike, Junichi (Tohoku University, Japan)
Editor Lacopi, Francesca
Editor Usui, Takamasa

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