Statistical Analysis of Spatial and Spatio-Temporal Point Patterns - Chapman & Hall / CRC Monographs on Statistics and Applied Probability - Peter J. Diggle - Books - Taylor & Francis Ltd - 9781032477473 - January 21, 2023
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Peter J. Diggle
Statistical Analysis of Spatial and Spatio-Temporal Point Patterns - Chapman & Hall / CRC Monographs on Statistics and Applied Probability 3rd edition

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Retaining all the material from the second edition and adding substantial new material, this third edition presents models and statistical methods for analyzing spatially referenced point process data. Reflected in the title, this edition now covers spatio-temporal point patterns. It also incorporates the use of R through several packages dedica

300 pages, 117 Illustrations, black and white

Media Books     Paperback Book   (Book with soft cover and glued back)
Released January 21, 2023
ISBN13 9781032477473
Publishers Taylor & Francis Ltd
Pages 300
Dimensions 150 × 220 × 10 mm   ·   540 g

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