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Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists - Advances in Materials Science and Engineering ZhiLi, Dong (Nanyang Technological University, Singapore)
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Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists - Advances in Materials Science and Engineering
ZhiLi, Dong (Nanyang Technological University, Singapore)
The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics.
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | November 27, 2025 |
| ISBN13 | 9781032246802 |
| Publishers | Taylor & Francis Ltd |
| Pages | 272 |
| Dimensions | 150 × 220 × 10 mm · 500 g |
| Language | English |
