High Resolution X-Ray Diffractometry And Topography - D.K. Bowen - Books - Taylor & Francis Ltd - 9780850667585 - February 5, 1998
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D.K. Bowen
High Resolution X-Ray Diffractometry And Topography 1st edition

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The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research. It provides the background for applying these techniques.

264 pages, black & white illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 5, 1998
ISBN13 9780850667585
Publishers Taylor & Francis Ltd
Pages 262
Dimensions 178 × 263 × 20 mm   ·   656 g
Language English  

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