Testing Reliability & Appltcns of Optoelectronic: 4285 (Proceedings of Spie--the International Society for Optical Engineering, V. 4285.) - Chin - Books - SPIE Press - 9780819439635 - June 30, 2006
In case cover and title do not match, the title is correct

Chin
Testing Reliability & Appltcns of Optoelectronic: 4285 (Proceedings of Spie--the International Society for Optical Engineering, V. 4285.)

Get an email once the item is available
Do you have a profile? Log in
Get notified about new Chin releases

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Not rated yet

246 pages, illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 30, 2006
ISBN13 9780819439635
Publishers SPIE Press
Pages 246
Dimensions 150 × 220 × 10 mm   ·   546 g   (Weight (estimated))

More from the same publisher

See all of Chin