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Microelectronic Manufacturing Yield Reliability and Failure Analysis-25-26 October 1995 Austin Texas Piccoli
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Microelectronic Manufacturing Yield Reliability and Failure Analysis-25-26 October 1995 Austin Texas
Piccoli
284 pages, illustrations
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | December 31, 1995 |
| ISBN13 | 9780819420015 |
| Publishers | SPIE Press |
| Pages | 284 |
| Dimensions | 150 × 220 × 10 mm · 629 g (Weight (estimated)) |
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