Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science - Hisham Haddara - Books - Springer - 9780792396956 - January 31, 1996
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Hisham Haddara
Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science 1995 edition

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The need for more deep and extensive characterization of MOSFET param eters has further increased as the applications of this device have gained ground in many new fields in which its performance has become more and more sensi tive to the properties of its Si - Si0 interface.

232 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released January 31, 1996
ISBN13 9780792396956
Publishers Springer
Pages 232
Dimensions 155 × 235 × 15 mm   ·   530 g
Language English  
Editor Haddara, Hisham

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