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Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II L Skuja 2000 edition
Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II
L Skuja
Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000
624 pages, 87 black & white illustrations, biography