Statistical Metrology: 6th International Workshop - Institute of Electrical and Electronics Engineers - Books - I.E.E.E.Press - 9780780366886 - 2001
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Institute of Electrical and Electronics Engineers
Statistical Metrology: 6th International Workshop

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The proceedings of the 6th International Workshop on Statistical Metrology, held in 2001. The papers cover: yield ramping methodology; metrology for statistical process control; sensor and measurement technology; spatial and temporal variation analysis methods; robust design; and more.

Media Books     Paperback Book   (Book with soft cover and glued back)
Released 2001
ISBN13 9780780366886
Publishers I.E.E.E.Press
Pages 100
Dimensions 203 × 230 × 6 mm   ·   290 g   (Weight (estimated))
Language English  

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