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Electron Microscopy and Analysis 2001 - Institute of Physics Conference Series 1st edition
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Electron Microscopy and Analysis 2001 - Institute of Physics Conference Series
Electron microscopy is a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. This book presents a useful snapshot of the developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies.
529 pages, Illustrations
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | December 1, 2001 |
| ISBN13 | 9780750308120 |
| Publishers | Taylor & Francis Ltd |
| Pages | 529 |
| Dimensions | 150 × 220 × 20 mm · 929 g |
| Language | English |
| Editor | Aindow, M. (University of Connecticut, USA) |
| Editor | Kiely, C. J. (Department of Engineering, University of Liverpool, UK) |
