Electronic Thin-Film Reliability - Tu, King-Ning (University of California, Los Angeles) - Books - Cambridge University Press - 9780521516136 - November 25, 2010
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Electronic Thin-Film Reliability

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Based on a graduate course at UCLA, this book describes reliability and failure of thin films. Beginning with core topics such as deposition and diffusion, the book fully explains irreversible processes with practical examples. Closing with failure analysis, this book is ideal for graduate students, researchers and practitioners.


412 pages, 186 b/w illus. 23 tables

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 25, 2010
ISBN13 9780521516136
Publishers Cambridge University Press
Pages 412
Dimensions 180 × 254 × 23 mm   ·   970 g
Language English  

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