Applied Charged Particle Optics: Part II - Advances in Imaging and Electron Physics -  - Books - Elsevier Science Publishing Co Inc - 9780443471124 - August 1, 2026
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Applied Charged Particle Optics: Part II - Advances in Imaging and Electron Physics

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Expected delivery Aug 10 - 13
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Media Books     Hardcover Book   (Book with hard spine and cover)
To be released August 1, 2026
ISBN13 9780443471124
Publishers Elsevier Science Publishing Co Inc
Pages 258
Dimensions 150 × 220 × 20 mm   ·   549 g   (Weight (estimated))
Series Editor Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
Series Editor Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France)

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