Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology - Adam Foster - Books - Springer-Verlag New York Inc. - 9780387400907 - June 28, 2006
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Adam Foster
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology And Ed. edition

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Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.

282 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 28, 2006
ISBN13 9780387400907
Publishers Springer-Verlag New York Inc.
Pages 282
Dimensions 155 × 235 × 17 mm   ·   589 g

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