Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM - R.F. Egerton - Books - Springer-Verlag New York Inc. - 9780387258003 - August 3, 2005
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R.F. Egerton
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM 1st ed. 2005. Corr. 2nd printing 2011 edition

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.

216 pages, 122 black & white illustrations, 5 black & white tables, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released August 3, 2005
Original release date 2008
ISBN13 9780387258003
Publishers Springer-Verlag New York Inc.
Pages 202
Dimensions 155 × 235 × 14 mm   ·   430 g
Language English  

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