Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation - - Books - Taylor & Francis Ltd - 9780367446802 - June 30, 2020
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Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation 1st edition

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Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the

368 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 30, 2020
ISBN13 9780367446802
Publishers Taylor & Francis Ltd
Pages 368
Dimensions 150 × 220 × 10 mm   ·   680 g
Language English  
Editor Fitzpatrick, M.E.
Editor Lodini, Alain

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