Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, - Lawrence E. Murr - Books - Taylor & Francis Ltd - 9780367402945 - October 29, 2019
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Lawrence E. Murr
Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, 2nd edition

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The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

856 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 29, 2019
ISBN13 9780367402945
Publishers Taylor & Francis Ltd
Pages 856
Dimensions 150 × 220 × 10 mm   ·   453 g
Language English  
Editor Murr, Lawrence E

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