Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach - Lall, Pradeep (Auburn University, Alabama, USA) - Books - Taylor & Francis Ltd - 9780367400972 - June 19, 2019
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Lall, Pradeep (Auburn University, Alabama, USA)
Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach 1st edition

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This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures.

336 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 19, 2019
ISBN13 9780367400972
Publishers Taylor & Francis Ltd
Pages 336
Dimensions 150 × 220 × 10 mm   ·   453 g
Language English  

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