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Rapid Reliability Assessment of VLSICs A.P. Dorey 1990 edition
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Rapid Reliability Assessment of VLSICs
A.P. Dorey
The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service.
200 pages, bibliography
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | April 30, 1990 |
| ISBN13 | 9780306434921 |
| Publishers | Springer Science+Business Media |
| Pages | 212 |
| Dimensions | 150 × 220 × 20 mm · 504 g (Weight (estimated)) |
| Language | English |