Defect and Microstructure Analysis by Diffraction - International Union of Crystallography Monographs on Crystallography - Robert L. Snyder - Books - Oxford University Press - 9780198501893 - March 16, 2000
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Robert L. Snyder
Defect and Microstructure Analysis by Diffraction - International Union of Crystallography Monographs on Crystallography

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Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction.

808 pages, numerous line figures

Media Books     Hardcover Book   (Book with hard spine and cover)
Released March 16, 2000
ISBN13 9780198501893
Publishers Oxford University Press
Pages 808
Dimensions 164 × 238 × 49 mm   ·   1.30 kg
Language English  
Editor Bunge, Hans J (Department of Physical Metallurgy, Department of Physical Metallurgy, Technical University of Clausthal, Germany)
Editor Fiala, Jaroslav (Department of Metallurgy, Department of Metallurgy, Central Research Institute Skoda, Czech Republic)
Editor Snyder, Robert (, Department of Materials Science and Engineering, Columbus, USA)

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