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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Peter W. Hawkes 161 edition
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers
Peter W. Hawkes
Includes articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in different domains.
304 pages, figures
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | March 25, 2010 |
| ISBN13 | 9780123813183 |
| Publishers | Elsevier Science Publishing Co Inc |
| Pages | 304 |
| Dimensions | 151 × 229 × 20 mm · 521 g |
| Series Editor | Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) |
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