Applied Scanning Probe Methods III: Characterization - NanoScience and Technology -  - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642065965 - February 12, 2010
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Applied Scanning Probe Methods III: Characterization - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2006 edition

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There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.


378 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 12, 2010
ISBN13 9783642065965
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 378
Dimensions 155 × 235 × 21 mm   ·   639 g
Language German  
Editor Bhushan, Bharat
Editor Fuchs, Harald

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