Adam Foster
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology Adam Foster Softcover reprint of hardcover 1st ed. 2006 edition

Name: Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology
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Author: Adam Foster

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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology

Adam Foster

Softcover reprint of hardcover 1st ed. 2006 edition

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.

282 pages, biography

Media	Books Paperback Book (Book with soft cover and glued back)
Released	November 23, 2010
ISBN13	9781441923066
Publishers	Springer-Verlag New York Inc.
Pages	282
Dimensions	155 × 235 × 16 mm · 417 g
Language	English